Silicon Carbide (SiC) Substrate

Silicon Carbide (SiC) substrates enable next-generation power efficiency, high-temperature reliability, and superior RF performance. Supwafer supplies epi-ready 4H and 6H SiC wafers with industry-grade metrology, micropipe control, and flexible sizing for R&D and production.

Silicon Carbide (SiC) is a wide-bandgap (WBG) semiconductor that outperforms silicon for high-voltage, high-frequency, and high-temperature applications. Key material advantages:

SiC Polytypes & Conductivity

Common Polytypes

    • 4H-SiC — industry standard for power electronics and RF; best balance of mobility and stability.

    • 6H-SiC — used in some high-temperature sensors and UV LEDs; cost-effective for niche uses.

    • 3C-SiC (cubic) — higher mobility but limited large-scale production; mostly research.

    • Emerging: 8-inch/8H research and pilot lines are under development; adoption expected to grow.

Conductivity Options

    • Conductive (n-type) — nitrogen doping for power MOSFETs, diodes.

    • Semi-insulating (SI) — vanadium compensated or intrinsic; resistivity >10⁹ Ω·cm for RF/microwave substrates and low-loss microwave circuits.

Typical Specifications (Standard & Custom Options)

Supwafer offers standard wafers and custom sizes; tighter tolerances available on request.

Parameter Typical Range / Option
Diameter/Size 25 mm(2"), 50mm(4"), 100 mm (4″), 150 mm (6″), 200 mm (8″), 300mm(12"),Square — custom on request
Thickness 350–1,000 µm depending on diameter; custom thickness available
Surface finish Epi-ready CMP, double-side polished (DSP), single-side polished (SSP)
TTV (Total Thickness Variation) ≤5 µm typical (tight control for epi processes)
Bow / Warp ≤40 µm (6″ typical) — tighter specs achievable
Micropipe density <0.1 cm⁻² industrial target; premium grades <0.01 cm⁻²
Surface roughness (Ra) Customize
Dislocation density <10⁴ cm⁻² (target for high-voltage device yield)
Epi-ready Yes — hydrogen anneal & CMP available for epi growth compatibility

Square Silicon Carbide Substrate

Size (mm) Type Size(mm) Type
3x3x0.35 4H - N 5x5x0.35 4H - N
8x8x0.35 4H - N 10x10x0.35 4H - N
5x10x0.35 4H/6H - N 10x20x0.35 4H/6H - N
We also offer custom services for other sizes. For details, please contact us for support.
Square Silicon Carbide Substrate
The morphological advantages of square silicon carbide substrates make them more suitable for specific fields, with typical applications including:
    • Power electronic devices: Used in manufacturing square-packaged SiC power diodes and MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors). They are compatible with scenarios requiring “miniaturization and high integration” such as new energy vehicle electronic control systems and industrial frequency converters, reducing the fitting gap between the substrate and the package housing.
    • RF and microwave devices: In high-frequency RF devices for some military radars and satellite communications, square substrates can better match planar circuit designs and reduce signal transmission losses.
    • Sensors and special devices: For example, high-temperature pressure sensors and ultraviolet detectors. The square structure facilitates precise alignment with the sensor’s electrodes and package bases; meanwhile, the high and low temperature resistance of silicon carbide ensures the sensors operate stably in extreme environments.

How SiC Substrates Are Manufactured (Key Notes)

Silicon carbide boules are typically grown by Physical Vapor Transport (PVT):

    1. Powder synthesis — high-purity SiC feedstock produced.

    2. Seed mounting — 4H seed attached in growth ampoule.

    3. High-temperature growth — sublimation @ 2300–2500°C deposits SiC on seed forming a boule.

    4. Slicing — diamond wire saw slices wafers from boule.

    5. Polish & inspection — CMP or diamond polishing to epi-ready surface, then metrology & CoA.

Notes & alternatives:

    • PVT is currently the dominant commercial method for 4H/6H production.

    • SSM (sublimation sandwich method) and other innovations improve yield and boule size; 8″ efforts are ongoing.

    • Epi-ready wafers require careful CMP and H₂ anneal to achieve oxide-free surfaces for epitaxy.

Key Applications & Use Cases

    • Electric Vehicles (EVs) — SiC MOSFETs and diodes in inverters and onboard chargers reduce switching losses and improve range.

    • Renewable Energy — solar and wind inverters benefit from higher efficiency and higher operating voltages.

    • 5G & RF — semi-insulating SiC substrates for high-power RF amplifiers and low-loss microwave circuits.

    • Aerospace & Defense — extreme temperature and radiation tolerance for radar and satellite systems.

    • Data Centers & Power Supplies — higher efficiency power conversion reduces losses and cooling needs.

Selection Guide — 4 Steps to Choose SiC Substrate​

    • Choose the polytype — 4H for power/RF; 6H for select high-temp applications.

    • Select conductivity — conductive (n-type) for power devices; SI for RF/microwave.

    • Match wafer size & epi readiness — 4″ for R&D, 6″ for production, 8″ for upcoming volume scaling.

    • Verify metrology & CoA — request micropipe density, TTV, resistivity (for conductive types), four-point probe maps, and dislocation counts.

Sic Substrate

Faqs:

1. What is a SiC substrate, and why is it important in semiconductor applications?

A SiC (Silicon Carbide) substrate is a single – crystal wafer made of silicon carbide. It’s crucial in semiconductors because of its wide bandgap, high thermal conductivity, and high breakdown electric field. These properties enable the development of high – power, high – frequency, and high – temperature electronic devices, outperforming traditional silicon in many harsh – environment and high – performance applications.

SiC has several polytypes, with 4H – SiC and 6H – SiC being the most common for substrates. 4H – SiC offers a good balance of high electron mobility and thermal properties, making it suitable for power devices. 6H – SiC has a more complex structure and is sometimes used in optoelectronic applications. The differences lie in their lattice constants, bandgaps, and electron transport characteristics, which impact device performance.

The main growth method is the physical vapor transport (PVT) method. Advantages include the ability to grow large – diameter (currently up to 6 – inch and beyond) and high – quality single crystals. Disadvantages are high growth temperatures (around 2000–2500 °C), slow growth rates, and the need for precise control of temperature gradients and gas flow. Other methods like chemical vapor deposition (CVD) are used for epitaxial layers but not yet as mature for bulk substrate growth.

Yes. For example, GaN (Gallium Nitride) can be epitaxially grown on SiC substrates. The lattice mismatch between SiC and GaN is relatively small, allowing for the fabrication of heterostructure devices. This combination leverages SiC’s high thermal conductivity and GaN’s high electron mobility for high – power and high – frequency applications like RF amplifiers.

SiC substrates are significantly more expensive than silicon substrates. Factors include the high cost of raw materials, the complex and slow growth process (PVT requires high temperatures and specialized equipment), and lower yields during crystal growth and wafer processing. However, as technology matures and production scales up, costs are gradually decreasing.

Commercially, SiC substrates are available in diameters ranging from 2 inches to 6 inches (and development is ongoing for larger sizes). Thicknesses can vary, but for typical device fabrication, wafer thicknesses are in the range of several hundred micrometers. The thickness is related to mechanical stability during processing and device operation, especially for high – power applications where heat dissipation is critical.

In EVs, SiC substrates are used to fabricate power devices (such as MOSFETs and diodes) in the traction inverter. These devices can operate at higher temperatures and voltages, enabling more efficient power conversion, reduced energy loss, and smaller, lighter inverter systems. This contributes to increased driving range and improved overall performance of electric vehicles.

Characterization techniques include X – ray diffraction (XRD) for crystal structure and orientation analysis, atomic force microscopy (AFM) for surface roughness measurement, optical microscopy and electron microscopy for defect inspection (identifying micropipes, dislocations), and electrical characterization methods (such as Hall effect measurements) to determine carrier concentration and mobility. These techniques ensure that the substrates meet the strict quality requirements for device fabrication.

Source from suppliers or grow in-house by aligning seed crystals with precision fixtures; verify via X-ray diffraction.

Use in-situ optical interference monitoring, regulate source material via mass-flow controllers, or fine-tune with post-growth thinning.

Fabricate ultra-thin layers, combine with flexible polymers via CVD, or use nano/micro-structuring to relieve stress.

Use recycled/lower-grade substrates (with treatment), optimize growth yield, or collaborate to share costs.

Use MD for atomic processes, FEA for thermal/mechanical modeling, CFD for gas flow, or specialized semiconductor growth software.

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